Images

Get a picture of our institute!

 

For a successful visual presentation of a message, the use of images is indispensable in addition to text elements. Therefore, we are pleased to provide you with some pictures of our institute and our research.

 

All images on this page and on possible subpages on this website are protected by copyright and may be used free of charge only with the respective copyright and source information (noted in each case in the caption) and in connection with the topics mentioned. Graphical alterations of the images are not permitted without prior consultation with the Fraunhofer IMS.

 

If you have any questions or require further printable or web-compatible image material, please contact us - if available, we will be happy to provide it.

 

© Fraunhofer IMS/Judith Büthe
Exterior view of Fraunhofer IMS
© Fraunhofer IMS/Judith Büthe
Exterior view of Fraunhofer IMS
© Fraunhofer IMS/Judith Büthe
Exterior view of Fraunhofer IMS
© Fraunhofer IMS/Judith Büthe
Interior shot Fraunhofer IMS
© Fraunhofer IMS/Judith Büthe
Exterior shot of Fraunhofer inHaus Center 2
© Guido Erbring
Exterior shot of Fraunhofer inHaus Center 1
© Fraunhofer IMS
Insights into our cleanrooms.
© Fraunhofer IMS
Insights into our cleanrooms.
© Fraunhofer IMS
Insights into our cleanrooms.
© Fraunhofer IMS
Insights into our cleanrooms.
© Fraunhofer IMS
Insights into our cleanrooms.
© Fraunhofer IMS
Insights into our cleanrooms.
© Fraunhofer IMS/Judith Büthe
Insights into our high-frequency lab.
© Fraunhofer IMS/Judith Büthe
Insights into our high-frequency lab.
© Fraunhofer IMS/Judith Büthe
Insights into our high-frequency lab.
© Fraunhofer IMS/Judith Büthe
Insights into our bio lab.
© Fraunhofer IMS/Judith Büthe
Insights into our bio lab.
© Fraunhofer IMS/Judith Büthe
Insights into our bio lab.
© Fraunhofer IMS/Judith Büthe
Insights into our optics laboratory.
© Fraunhofer IMS/Judith Büthe
Insights into our ASIC testing lab.
© Fraunhofer IMS/Judith Büthe
Insights into our ASIC testing lab.
© Fraunhofer IMS
Impressions from the institute.
CMOS wafer with the image sensor CSPAD αlpha
© Fraunhofer IMS
Impressions from the institute.
Chip-Scale Packages for 3D-Integration in Microelectronics
© Fraunhofer IMS
Impressions from the institute.